Capabilities:

• High-resolution imaging of biological and other advanced samples in air or liquid

• Fast scanning option up to 70Hz line rate with a 100μm scanner

• A comprehensive set of AFM modes like JPK's easy-to-use QI mode, contact mode with lateral force, advanced AC modes like non-contact, phase detection, electrical and magnetic imaging modes

• Tip scanning technology for safe and easy operation in air, gases and fluids 100x100x15μm³ scan range with lowest noise levels in closed-loop

• Precise force spectroscopy and quantitative nanomechanical imaging

• Nanomanipulation and nanolithography

• Advanced characterization of mechanical, chemical, electrical, optical and magnetic material properties

• Compatible with transmission optical capabilities using a "standard condenser lens": e.g. brightfield, phase contrast, Hoffman modulation or DIC simultaneous to AFM imaging

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Illumination:

• Halogen transmitted light source

• X-cite LED

 

Objectives: 10x/0.5

Filter cubes: DAPI, FITC/GFP, TRITC/RFP, Cy5
Software: JPK acquisition software