AFM Systems

Zeiss Axiovert 200M + NanoWizard 4

 

Description: 

  Inverted epifluorescence Axiovert 200M microscope equipped with JPK's Nanowizard 4 platform for AFM

Capabilities:

  High-resolution imaging of biological and other advanced samples in air

or liquid

  Fast scanning option up to 70Hz line rate with a 100μm scanner

  Comprehensive set of AFM modes like JPK's easy-to-use QI mode, contact

mode with lateral force, advanced AC modes like non-contact, phase detection,

electrical and magnetic imaging modes

  Tip scanning technology for safe and easy operation in air, gases and fluids

  100x100x15μm³ scan range with lowest noise levels in closed loop

  Precise force spectroscopy and quantitative nanomechanical imaging

  Nanomanipulation and nanolithography

  Advanced characterization of mechanical, chemical, electrical, optical and

magnetic material properties

  Compatible with transmission optical capabilities using a "standard condenser

lens": e.g. brightfield, phase contrast, Hoffman modulation or DIC simultaneous

to AFM imaging

Illumination:

Halogen transmitted light source

X-cite LED

 

Objectives:

10x/0.5

 

Filter cubes: DAPI, FITC/GFP, TRITC/RFP, Cy5


Software: JPK acquisition software

Zeiss LSM800 + NanoWizard 4

 

Description: 

Inverted Axio Observer 7 confocal microscope with LSM800 scanhead equipped with JPK's Nanowizard 4 platform for AFM

Booking:

Please let us know when you would like to use this option as it involves some

physical adjustments to the confocal system in order to adopt the NanoWizard 4

Capabilities:

  High-resolution imaging of biological and other advanced samples in air

or liquid

  Fast scanning option up to 70Hz line rate with a 100μm scanner

  Comprehensive set of AFM modes like JPK's easy-to-use QI mode, contact

mode with lateral force, advanced AC modes like non-contact, phase detection,

electrical and magnetic imaging modes

  Tip scanning technology for safe and easy operation in air, gases and fluids

  100x100x15μm³ scan range with lowest noise levels in closed loop

  Precise force spectroscopy and quantitative nanomechanical imaging

  Nanomanipulation and nanolithography

  Advanced characterization of mechanical, chemical, electrical, optical and

magnetic material properties

  Compatible with transmission optical capabilities using a "standard condenser

lens": e.g. brightfield, phase contrast, Hoffman modulation or DIC simultaneous

to AFM imaging

  Possibility to acquire confocal images and combine them with your AFM data

 

LSM 800 Lasers:

Diode laser 405nm, 5mW

Diode laser 488nm,10mW

Diode laser (SHG) 561nm, 10mW

Diode laser 640nm, 5mW

 

Objectives:

PApo 10x/0.45

PApo 20x/0.8

Plan-APO 40x/1.40 Oil DIC

Plan-Apochromat 63x/1.40 Oil DIC

 

LSM 800 Detectors:

2 GaAsP PMT with a variable splitter dichroic


Software: JPK acquisition software + ZEN blue 2.6

Faculty of Dentistry

University of Toronto

124 Edward Street

4th floor

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